Defects in Advanced Electronic Materials and Novel Low Dimen (Paperback)
 
作者: Weimin Chen 
書城編號: 1450039


售價: $2310.00

購買後立即進貨, 約需 18-25 天

 
 
出版社: Elsevier Science & Technology
出版日期: 2018/06/21
尺寸: 153x228x15mm
重量: 0.41 kg
ISBN: 9780081020531
 
>> 相關電子書

商品簡介


Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory.

While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap.

Weimin Chen 作者作品表

Defects in Advanced Electronic Materials and Novel Low Dimen (Paperback)

Handbook of Spintronic Semiconductors

* 以上資料僅供參考之用, 香港書城並不保證以上資料的準確性及完整性。
* 如送貨地址在香港以外, 當書籍/產品入口時, 顧客須自行繳付入口關稅和其他入口銷售稅項。

 

 

 

  我的賬戶 |  購物車 |  出版社 |  團購優惠
加入供應商 |  廣告刊登 |  公司簡介 |  條款及細則

香港書城 版權所有 私隱政策聲明

顯示模式: 電腦版 (改為: 手機版)